A comparison between leaf dielectric properties of stressed and unstressed tomato plants - researchr publication authors

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Tim van Emmerik, Susan C. Steele-Dunne, Jasmeet Judge, Nick van de Giesen. A comparison between leaf dielectric properties of stressed and unstressed tomato plants. In 2015 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015, Milan, Italy, July 26-31, 2015. pages 275-278, IEEE, 2015. [doi]

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