Tim van Emmerik, Susan C. Steele-Dunne, Jasmeet Judge, Nick van de Giesen. A comparison between leaf dielectric properties of stressed and unstressed tomato plants. In 2015 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015, Milan, Italy, July 26-31, 2015. pages 275-278, IEEE, 2015. [doi]
@inproceedings{EmmerikSJG15-0,
title = {A comparison between leaf dielectric properties of stressed and unstressed tomato plants},
author = {Tim van Emmerik and Susan C. Steele-Dunne and Jasmeet Judge and Nick van de Giesen},
year = {2015},
doi = {10.1109/IGARSS.2015.7325753},
url = {http://dx.doi.org/10.1109/IGARSS.2015.7325753},
researchr = {https://researchr.org/publication/EmmerikSJG15-0},
cites = {0},
citedby = {0},
pages = {275-278},
booktitle = {2015 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2015, Milan, Italy, July 26-31, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7929-5},
}