John M. Emmert, Jason A. Cheatham, Badhri Jagannathan, Sandeep Umarani. A Monolithic Spectral BIST Technique for Control or Test of Analog or Mixed-Signal Circuits. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 303, IEEE Computer Society, 2003. [doi]
@inproceedings{EmmertCJU03,
title = {A Monolithic Spectral BIST Technique for Control or Test of Analog or Mixed-Signal Circuits},
author = {John M. Emmert and Jason A. Cheatham and Badhri Jagannathan and Sandeep Umarani},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/dft/2003/2042/00/20420303abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/EmmertCJU03},
cites = {0},
citedby = {0},
pages = {303},
booktitle = {18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-2042-1},
}