Alex Endert, Christopher Andrews, Glenn A. Fink, Chris North. Professional analysts using a large, high-resolution display. In Proceedings of the IEEE Symposium on Visual Analytics Science and Technology, IEEE VAST 2009, Atlantic City, New Jersey, USA, 11-16 October 2009, part of VisWeek 2009. pages 273-274, IEEE, 2009. [doi]
Abstract is missing.