A study of cause-effect structure acquisition for anomaly diagnosis in discrete manufacturing processes

Maki Endo, Kosuke Tsuruta, Soichiro Kita, Hiroshi Nakajima. A study of cause-effect structure acquisition for anomaly diagnosis in discrete manufacturing processes. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, Singapore, 12-15 October 2008. pages 2099-2104, IEEE, 2008. [doi]

@inproceedings{EndoTKN08,
  title = {A study of cause-effect structure acquisition for anomaly diagnosis in discrete manufacturing processes},
  author = {Maki Endo and Kosuke Tsuruta and Soichiro Kita and Hiroshi Nakajima},
  year = {2008},
  doi = {10.1109/ICSMC.2008.4811601},
  url = {http://dx.doi.org/10.1109/ICSMC.2008.4811601},
  researchr = {https://researchr.org/publication/EndoTKN08},
  cites = {0},
  citedby = {0},
  pages = {2099-2104},
  booktitle = {Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, Singapore, 12-15 October 2008},
  publisher = {IEEE},
  isbn = {978-1-4244-2383-5},
}