Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker. Automatic Test Pattern Generation for Resistive Bridging Faults. J. Electronic Testing, 22(1):61-69, 2006. [doi]
@article{EngelkePRB06:0,
title = {Automatic Test Pattern Generation for Resistive Bridging Faults},
author = {Piet Engelke and Ilia Polian and Michel Renovell and Bernd Becker},
year = {2006},
doi = {10.1007/s10836-006-6392-x},
url = {http://dx.doi.org/10.1007/s10836-006-6392-x},
tags = {testing},
researchr = {https://researchr.org/publication/EngelkePRB06%3A0},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {22},
number = {1},
pages = {61-69},
}