Integrated Design and Test of Mixed-Signal Circuits

Nur Engin, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek. Integrated Design and Test of Mixed-Signal Circuits. J. Electronic Testing, 14(1-2):75-83, 1999. [doi]

Authors

Nur Engin

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Hans G. Kerkhoff

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Ronald J. W. T. Tangelder

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Han Speek

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