K. Virgil English, Islam Obaidat, Meera Sridhar. Exploiting Memory Corruption Vulnerabilities in Connman for IoT Devices. In 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2019, Portland, OR, USA, June 24-27, 2019. pages 247-255, IEEE, 2019. [doi]
@inproceedings{EnglishOS19, title = {Exploiting Memory Corruption Vulnerabilities in Connman for IoT Devices}, author = {K. Virgil English and Islam Obaidat and Meera Sridhar}, year = {2019}, doi = {10.1109/DSN.2019.00036}, url = {https://doi.org/10.1109/DSN.2019.00036}, researchr = {https://researchr.org/publication/EnglishOS19}, cites = {0}, citedby = {0}, pages = {247-255}, booktitle = {49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2019, Portland, OR, USA, June 24-27, 2019}, publisher = {IEEE}, isbn = {978-1-7281-0057-9}, }