K. Virgil English, Islam Obaidat, Meera Sridhar. Exploiting Memory Corruption Vulnerabilities in Connman for IoT Devices. In 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2019, Portland, OR, USA, June 24-27, 2019. pages 247-255, IEEE, 2019. [doi]
Abstract is missing.