Novel method for high speed force curve measurement considering cantilever dynamics for atomic force microscopy

Tomoki Enmei, H. Fujimoto, Y. Hori. Novel method for high speed force curve measurement considering cantilever dynamics for atomic force microscopy. In IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society, Yokohama, Japan, November 9-12, 2015. pages 4760-4765, IEEE, 2015. [doi]

Abstract

Abstract is missing.