Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures

Robert Entner, Tibor Grasser, Oliver Triebl, Hubert Enichlmair, Rainer Minixhofer. Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures. Microelectronics Reliability, 47(4-5):697-699, 2007. [doi]

Authors

Robert Entner

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Tibor Grasser

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Oliver Triebl

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Hubert Enichlmair

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Rainer Minixhofer

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