Characterization and fatigue damage simulation in SAC solder joints

Müge Erinc, Piet J. G. Schreurs, G. Q. Zhang, Marc G. D. Geers. Characterization and fatigue damage simulation in SAC solder joints. Microelectronics Reliability, 44(9-11):1287-1292, 2004. [doi]

Abstract

Abstract is missing.