Defect Detection in Transparent Printed Electronics Using Learning-Based Optical Inspection

Ahmet Turan Erozan, Simon Bosse, Mehdi B. Tahoori. Defect Detection in Transparent Printed Electronics Using Learning-Based Optical Inspection. IEEE Trans. VLSI Syst., 29(8):1505-1517, 2021. [doi]

Authors

Ahmet Turan Erozan

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Simon Bosse

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Mehdi B. Tahoori

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