Egor I. Ershov, Arseniy P. Terekhin, Dmitriy Nikolaev, Vassili V. Postnikov, Simon M. Karpenko. Fast Hough transform analysis: pattern deviation from line segment. In Antanas Verikas, Petia Radeva, Dmitry P. Nikolaev, editors, Eighth International Conference on Machine Vision, ICMV 2015, Barcelona, Spain, 19-20 November 2015. Volume 9875 of SPIE Proceedings, pages 987509, SPIE, 2015. [doi]
Abstract is missing.