Mustafa Eryilmaz, Metehan Çil, Sedat Aktürk, Mehmet Tilegi, Hakan Tirak, Atila Yilmaz, Seniha Esen Yüksel, Dinçer Gökcen. Defect Classification from Electronic Card Images by Deep Learning. In 30th Signal Processing and Communications Applications Conference, SIU 2022, Safranbolu, Turkey, May 15-18, 2022. pages 1-4, IEEE, 2022. [doi]
Abstract is missing.