Thomas Esch, Andreas Schenk, Michael Thiel, Tobias Ullmann, Martin Schmidt, Stefan W. Dech. Land cover classification based on single-polarized VHR SAR images using texture information derived via speckle analysis. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2010, July 25-30, 2010, Honolulu, Hawaii, USA, Proceedings. pages 1875-1878, IEEE, 2010. [doi]
Abstract is missing.