An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes

Baris Esen, Anthony Coyette, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren. An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes. IEEE Design & Test of Computers, 35(3):15-23, 2018. [doi]

@article{EsenCXGDV18,
  title = {An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes},
  author = {Baris Esen and Anthony Coyette and Nektar Xama and Georges G. E. Gielen and Wim Dobbelaere and Ronny Vanhooren},
  year = {2018},
  doi = {10.1109/MDAT.2018.2799803},
  url = {https://doi.org/10.1109/MDAT.2018.2799803},
  researchr = {https://researchr.org/publication/EsenCXGDV18},
  cites = {0},
  citedby = {0},
  journal = {IEEE Design & Test of Computers},
  volume = {35},
  number = {3},
  pages = {15-23},
}