Characterization and Architecture of Monolithic N⁺P-CMOS-SiPM Array for ToF Measurements

A. Eshkoli, Yael Nemirovsky. Characterization and Architecture of Monolithic N⁺P-CMOS-SiPM Array for ToF Measurements. IEEE T. Instrumentation and Measurement, 70:1-9, 2021. [doi]

Abstract

Abstract is missing.