Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits

Michael Ogbonna Esonu, Dhamin Al-Khalili, Côme Rozon. Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits. VLSI Design, 1(4):261-276, 1994. [doi]

Authors

Michael Ogbonna Esonu

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Dhamin Al-Khalili

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Côme Rozon

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