Robert C. Evans. Testing Repairable RAMs and Mostly Good Memories. In Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981. pages 49-55, IEEE Computer Society, 1981.
@inproceedings{Evans81:0,
title = {Testing Repairable RAMs and Mostly Good Memories},
author = {Robert C. Evans},
year = {1981},
tags = {testing, C++},
researchr = {https://researchr.org/publication/Evans81%3A0},
cites = {0},
citedby = {0},
pages = {49-55},
booktitle = {Proceedings International Test Conference 1981, Philadelphia, PA, USA, October 1981},
publisher = {IEEE Computer Society},
}