William P. Evans, David Burnell. Deep submicron effects on data converter building blocks. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 725-728, IEEE, 2008. [doi]
@inproceedings{EvansB08,
title = {Deep submicron effects on data converter building blocks},
author = {William P. Evans and David Burnell},
year = {2008},
doi = {10.1109/CICC.2008.4672189},
url = {http://dx.doi.org/10.1109/CICC.2008.4672189},
researchr = {https://researchr.org/publication/EvansB08},
cites = {0},
citedby = {0},
pages = {725-728},
booktitle = {Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008},
publisher = {IEEE},
isbn = {978-1-4244-2018-6},
}