Using Machine Learning to Detect and Locate Rogue Devices from Time-Domain Reflectometry - researchr publication

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Michael Eydenberg, Jason J. Haas. Using Machine Learning to Detect and Locate Rogue Devices from Time-Domain Reflectometry. In IEEE Military Communications Conference, MILCOM 2025, Los Angeles, CA, USA, October 6-10, 2025. pages 745-751, IEEE, 2025. [doi]

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