Fevziye Irem Eyiokur, Dogucan Yaman, Hazim Kemal Ekenel, Alexander Waibel. Exposure Correction Model to Enhance Image Quality. In IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2022, New Orleans, LA, USA, June 19-20, 2022. pages 675-685, IEEE, 2022. [doi]
Abstract is missing.