Lev Faivishevsky, Adi Szeskin, Ashwin K. Muppalla, Ravid Shwartz-Ziv, Itamar Ben-Ari, Ronen Laperdon, Benjamin Melloul, Tahi Hollander, Tom Hope, Amitai Armon. Automated Testing of Graphics Units by Deep-Learning Detection of Visual Anomalies. In Feida Zhu 0002, Beng Chin Ooi, Chunyan Miao, editors, KDD '21: The 27th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, Virtual Event, Singapore, August 14-18, 2021. pages 2811-2821, ACM, 2021. [doi]
Abstract is missing.