Moein Falahatgar, Ashkan Jafarpour, Alon Orlitsky, Venkatadheeraj Pichapati, Ananda Theertha Suresh. Estimating the number of defectives with group testing. In IEEE International Symposium on Information Theory, ISIT 2016, Barcelona, Spain, July 10-15, 2016. pages 1376-1380, IEEE, 2016. [doi]
@inproceedings{FalahatgarJOPS16,
title = {Estimating the number of defectives with group testing},
author = {Moein Falahatgar and Ashkan Jafarpour and Alon Orlitsky and Venkatadheeraj Pichapati and Ananda Theertha Suresh},
year = {2016},
doi = {10.1109/ISIT.2016.7541524},
url = {http://dx.doi.org/10.1109/ISIT.2016.7541524},
researchr = {https://researchr.org/publication/FalahatgarJOPS16},
cites = {0},
citedby = {0},
pages = {1376-1380},
booktitle = {IEEE International Symposium on Information Theory, ISIT 2016, Barcelona, Spain, July 10-15, 2016},
publisher = {IEEE},
isbn = {978-1-5090-1806-2},
}