Moein Falahatgar, Ashkan Jafarpour, Alon Orlitsky, Venkatadheeraj Pichapati, Ananda Theertha Suresh. Estimating the number of defectives with group testing. In IEEE International Symposium on Information Theory, ISIT 2016, Barcelona, Spain, July 10-15, 2016. pages 1376-1380, IEEE, 2016. [doi]
Abstract is missing.