Wei Fan, Ian Davidson. Reverse testing: an efficient framework to select amongst classifiers under sample selection bias. In Tina Eliassi-Rad, Lyle H. Ungar, Mark Craven, Dimitrios Gunopulos, editors, Proceedings of the Twelfth ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, Philadelphia, PA, USA, August 20-23, 2006. pages 147-156, ACM, 2006. [doi]
Abstract is missing.