Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications

Ming-Long Fan, Vita Pi-Ho Hu, Yin-Nien Chen, Pin Su, Ching-Te Chuang. Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications. IEEE Trans. on Circuits and Systems, 59-II(12):878-882, 2012. [doi]

@article{FanHCSC12,
  title = {Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications},
  author = {Ming-Long Fan and Vita Pi-Ho Hu and Yin-Nien Chen and Pin Su and Ching-Te Chuang},
  year = {2012},
  doi = {10.1109/TCSII.2012.2231016},
  url = {http://dx.doi.org/10.1109/TCSII.2012.2231016},
  researchr = {https://researchr.org/publication/FanHCSC12},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on Circuits and Systems},
  volume = {59-II},
  number = {12},
  pages = {878-882},
}