Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications

Ming-Long Fan, Vita Pi-Ho Hu, Yin-Nien Chen, Pin Su, Ching-Te Chuang. Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications. IEEE Trans. on Circuits and Systems, 59-II(12):878-882, 2012. [doi]

Abstract

Abstract is missing.