Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing

Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Fei He, Chun-Chung Cheng. Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing. IEEE T. Automation Science and Engineering, 17(4):1925-1936, 2020. [doi]

Authors

Shu-Kai S. Fan

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Chia-Yu Hsu

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Du-Ming Tsai

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Fei He

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Chun-Chung Cheng

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