Luxi Fan, Zheng Li 0002, Hengyuan Liu, Doyle Paul, Haifeng Wang, Xiang Chen 0005, Yong Liu. SGS: Mutant Reduction for Higher-order Mutation-based Fault Localization. In Hossain Shahriar, Yuuichi Teranishi, Alfredo Cuzzocrea, Moushumi Sharmin, Dave Towey, A. K. M. Jahangir Alam Majumder, Hiroki Kashiwazaki, Ji-Jiang Yang, Michiharu Takemoto, Nazmus Sakib, Ryohei Banno, Sheikh Iqbal Ahamed, editors, 47th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2023, Torino, Italy, June 26-30, 2023. pages 870-875, IEEE, 2023. [doi]
Abstract is missing.