Extending gate-level diagnosis tools to CMOS intra-gate faults

Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud. Extending gate-level diagnosis tools to CMOS intra-gate faults. IET Computers & Digital Techniques, 1(6):685-693, 2007. [doi]

@article{FanMHG07,
  title = {Extending gate-level diagnosis tools to CMOS intra-gate faults},
  author = {Xinyue Fan and Will R. Moore and Camelia Hora and Guido Gronthoud},
  year = {2007},
  doi = {10.1049/iet-cdt:20060206},
  url = {http://dx.doi.org/10.1049/iet-cdt:20060206},
  researchr = {https://researchr.org/publication/FanMHG07},
  cites = {0},
  citedby = {0},
  journal = {IET Computers & Digital Techniques},
  volume = {1},
  number = {6},
  pages = {685-693},
}