Xiaoxin Fan, Sudhakar M. Reddy, Senling Wang, Seiji Kajihara, Yasuo Sato. Genetic algorithm based approach for segmented testing. In IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2011), Hong Kong, China, June 27-30, 2011. pages 85-90, IEEE, 2011. [doi]
@inproceedings{FanRWKS11,
title = {Genetic algorithm based approach for segmented testing},
author = {Xiaoxin Fan and Sudhakar M. Reddy and Senling Wang and Seiji Kajihara and Yasuo Sato},
year = {2011},
doi = {10.1109/DSNW.2011.5958841},
url = {http://doi.ieeecomputersociety.org/10.1109/DSNW.2011.5958841},
researchr = {https://researchr.org/publication/FanRWKS11},
cites = {0},
citedby = {0},
pages = {85-90},
booktitle = {IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2011), Hong Kong, China, June 27-30, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0374-4},
}