Genetic algorithm based approach for segmented testing

Xiaoxin Fan, Sudhakar M. Reddy, Senling Wang, Seiji Kajihara, Yasuo Sato. Genetic algorithm based approach for segmented testing. In IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2011), Hong Kong, China, June 27-30, 2011. pages 85-90, IEEE, 2011. [doi]

Abstract

Abstract is missing.