Antony Fan, Joddy Wang, Vladimir Aptekar. Advanced Circuit Reliability Verification for Robust Design. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-8, IEEE, 2019. [doi]
@inproceedings{FanWA19, title = {Advanced Circuit Reliability Verification for Robust Design}, author = {Antony Fan and Joddy Wang and Vladimir Aptekar}, year = {2019}, doi = {10.1109/IRPS.2019.8720531}, url = {https://doi.org/10.1109/IRPS.2019.8720531}, researchr = {https://researchr.org/publication/FanWA19}, cites = {0}, citedby = {0}, pages = {1-8}, booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019}, publisher = {IEEE}, isbn = {978-1-5386-9504-3}, }