Hongxing Fan, Jiangtao Wu, Weinan Guan, Lu Sheng. Maximum Entropy Adversarial Learning for Generalizable Forgery Detection. In Josef Kittler, Hongkai Xiong, Jian Yang 0003, Xilin Chen 0001, Jiwen Lu, Weiyao Lin, Jingyi Yu 0002, Weishi Zheng 0001, editors, Pattern Recognition and Computer Vision - 8th Chinese Conference, PRCV 2025, Shanghai, China, October 15-18, 2025, Proceedings, Part XV. Volume 16286 of Lecture Notes in Computer Science, pages 298-312, Springer, 2025. [doi]
@inproceedings{FanWGS25,
title = {Maximum Entropy Adversarial Learning for Generalizable Forgery Detection},
author = {Hongxing Fan and Jiangtao Wu and Weinan Guan and Lu Sheng},
year = {2025},
doi = {10.1007/978-981-95-5628-1_21},
url = {https://doi.org/10.1007/978-981-95-5628-1_21},
researchr = {https://researchr.org/publication/FanWGS25},
cites = {0},
citedby = {0},
pages = {298-312},
booktitle = {Pattern Recognition and Computer Vision - 8th Chinese Conference, PRCV 2025, Shanghai, China, October 15-18, 2025, Proceedings, Part XV},
editor = {Josef Kittler and Hongkai Xiong and Jian Yang 0003 and Xilin Chen 0001 and Jiwen Lu and Weiyao Lin and Jingyi Yu 0002 and Weishi Zheng 0001},
volume = {16286},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-981-95-5628-1},
}