Hongxing Fan, Jiangtao Wu, Weinan Guan, Lu Sheng. Maximum Entropy Adversarial Learning for Generalizable Forgery Detection. In Josef Kittler, Hongkai Xiong, Jian Yang 0003, Xilin Chen 0001, Jiwen Lu, Weiyao Lin, Jingyi Yu 0002, Weishi Zheng 0001, editors, Pattern Recognition and Computer Vision - 8th Chinese Conference, PRCV 2025, Shanghai, China, October 15-18, 2025, Proceedings, Part XV. Volume 16286 of Lecture Notes in Computer Science, pages 298-312, Springer, 2025. [doi]
Abstract is missing.