Chen-Liang Fan, Chun-Jen Weng, Yu-Hsin Lin, Pi-Ying Cheng. Surface profiling measurement using varifocal lens based on focus stacking. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, USA, May 14-17, 2018. pages 1-5, IEEE, 2018. [doi]
@inproceedings{FanWLC18,
title = {Surface profiling measurement using varifocal lens based on focus stacking},
author = {Chen-Liang Fan and Chun-Jen Weng and Yu-Hsin Lin and Pi-Ying Cheng},
year = {2018},
doi = {10.1109/I2MTC.2018.8409820},
url = {https://doi.org/10.1109/I2MTC.2018.8409820},
researchr = {https://researchr.org/publication/FanWLC18},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, USA, May 14-17, 2018},
publisher = {IEEE},
isbn = {978-1-5386-2222-3},
}