Chen-Liang Fan, Chun-Jen Weng, Yu-Hsin Lin, Pi-Ying Cheng. Surface profiling measurement using varifocal lens based on focus stacking. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, USA, May 14-17, 2018. pages 1-5, IEEE, 2018. [doi]
Abstract is missing.