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Thermal/luminescence characterization and degradation mechanism analysis on phosphor-converted white LED chip scale packages

Jiajie Fan, Chaohua Yu, Cheng Qian, Xuejun Fan, Guoqi Zhang. Thermal/luminescence characterization and degradation mechanism analysis on phosphor-converted white LED chip scale packages. Microelectronics Reliability, 74:179-185, 2017. [doi]

Authors

Jiajie Fan

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Chaohua Yu

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Cheng Qian

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Xuejun Fan

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Guoqi Zhang

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