Thermal/luminescence characterization and degradation mechanism analysis on phosphor-converted white LED chip scale packages

Jiajie Fan, Chaohua Yu, Cheng Qian, Xuejun Fan, Guoqi Zhang. Thermal/luminescence characterization and degradation mechanism analysis on phosphor-converted white LED chip scale packages. Microelectronics Reliability, 74:179-185, 2017. [doi]

Abstract

Abstract is missing.