On-Line Detection of Defects in Layered Manufacturing

Tong Fang, I. Bakhadyrov, Mohsen A. Jafari, G. Alpan. On-Line Detection of Defects in Layered Manufacturing. In ICRA. pages 254-259, 1998.

@inproceedings{FangBJA98,
  title = {On-Line Detection of Defects in Layered Manufacturing},
  author = {Tong Fang and I. Bakhadyrov and Mohsen A. Jafari and G. Alpan},
  year = {1998},
  researchr = {https://researchr.org/publication/FangBJA98},
  cites = {0},
  citedby = {0},
  pages = {254-259},
  booktitle = {ICRA},
}