Lei Fang, Michael S. Hsiao. Bilateral Testing of Nano-scale Fault-Tolerant Circuits. J. Electronic Testing, 24(1-3):285-296, 2008. [doi]
@article{FangH08,
title = {Bilateral Testing of Nano-scale Fault-Tolerant Circuits},
author = {Lei Fang and Michael S. Hsiao},
year = {2008},
doi = {10.1007/s10836-007-5041-3},
url = {http://dx.doi.org/10.1007/s10836-007-5041-3},
tags = {testing},
researchr = {https://researchr.org/publication/FangH08},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {24},
number = {1-3},
pages = {285-296},
}