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Efficient Test Chip Design via Smart Computation

Chenlei Fang, Qicheng Huang, Zeye Liu 0001, Ruizhou Ding, Ronald D. Blanton. Efficient Test Chip Design via Smart Computation. ACM Trans. Design Autom. Electr. Syst., 28(2), March 2023. [doi]

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Chenlei Fang

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Qicheng Huang

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Zeye Liu 0001

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Ruizhou Ding

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Ronald D. Blanton

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