Chenlei Fang, Qicheng Huang, Zeye Liu 0001, Ruizhou Ding, Ronald D. Blanton. Efficient Test Chip Design via Smart Computation. ACM Trans. Design Autom. Electr. Syst., 28(2), March 2023. [doi]
@article{FangHLDB23,
title = {Efficient Test Chip Design via Smart Computation},
author = {Chenlei Fang and Qicheng Huang and Zeye Liu 0001 and Ruizhou Ding and Ronald D. Blanton},
year = {2023},
month = {March},
doi = {10.1145/3558393},
url = {https://doi.org/10.1145/3558393},
researchr = {https://researchr.org/publication/FangHLDB23},
cites = {0},
citedby = {0},
journal = {ACM Trans. Design Autom. Electr. Syst.},
volume = {28},
number = {2},
}