Tong Fang, Mohsen A. Jafari, Izzat Bakhadyrov, Ahmad Safari, Stephen C. Danforth, Noshir A. Langrana. Online defect detection in layered manufacturing using process signature. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, SMC 1998, Hyatt Regency La Jolla, San Diego, California, USA, October 11-14,1998. pages 4373-4378, IEEE, 1998. [doi]
Abstract is missing.