Jianxin Fang, Sachin S. Sapatnekar. Scalable Methods for Analyzing the Circuit Failure Probability Due to Gate Oxide Breakdown. IEEE Trans. VLSI Syst., 20(11):1960-1973, 2012. [doi]
@article{FangS12-2,
title = {Scalable Methods for Analyzing the Circuit Failure Probability Due to Gate Oxide Breakdown},
author = {Jianxin Fang and Sachin S. Sapatnekar},
year = {2012},
doi = {10.1109/TVLSI.2011.2166568},
url = {http://dx.doi.org/10.1109/TVLSI.2011.2166568},
researchr = {https://researchr.org/publication/FangS12-2},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {20},
number = {11},
pages = {1960-1973},
}