Tianyang Fang, Jafar Saniie, Sasan Bakhtiari, Alexander Heifetz. Probabilistic Creep Model for Recalibration of Microwave Cavity Flow Meter. In IEEE International Conference on Electro Information Technology, eIT 2024, Eau Claire, WI, USA, May 30 - June 1, 2024. pages 552-555, IEEE, 2024. [doi]
Abstract is missing.