Test-driving Intel Xeon Phi

Jianbin Fang, Henk J. Sips, Lilun Zhang, Chuanfu Xu, Yonggang Che, Ana Lucia Varbanescu. Test-driving Intel Xeon Phi. In Klaus-Dieter Lange, John Murphy, Walter Binder, José Merseguer, editors, ACM/SPEC International Conference on Performance Engineering, ICPE'14, Dublin, Ireland, March 22-26, 2014. pages 137-148, ACM, 2014. [doi]

Abstract

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