FastRecon: Few-shot Industrial Anomaly Detection via Fast Feature Reconstruction

Zheng Fang, Xiaoyang Wang, Haocheng Li, Jiejie Liu, Qiugui Hu, Jimin Xiao. FastRecon: Few-shot Industrial Anomaly Detection via Fast Feature Reconstruction. In IEEE/CVF International Conference on Computer Vision, ICCV 2023, Paris, France, October 1-6, 2023. pages 17435-17444, IEEE, 2023. [doi]

@inproceedings{FangWLLHX23,
  title = {FastRecon: Few-shot Industrial Anomaly Detection via Fast Feature Reconstruction},
  author = {Zheng Fang and Xiaoyang Wang and Haocheng Li and Jiejie Liu and Qiugui Hu and Jimin Xiao},
  year = {2023},
  doi = {10.1109/ICCV51070.2023.01603},
  url = {https://doi.org/10.1109/ICCV51070.2023.01603},
  researchr = {https://researchr.org/publication/FangWLLHX23},
  cites = {0},
  citedby = {0},
  pages = {17435-17444},
  booktitle = {IEEE/CVF International Conference on Computer Vision, ICCV 2023, Paris, France, October 1-6, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-0718-4},
}